Technical Papers

Design and Performance of High-Reliability Double-Layer Capacitors
presented at the 40th Electronic Components and Technology Conference, May 21, 1990
David A Evans and John R. Miller


This paper describes the development, testing, and use of a new, high-reliability, double-layer capacitor component designed for operation in the range -55 to +85C. This component offers a welded tantalum package with aninnovative design to provide long life with stable electrical performance. Details of the design are presented along with life and stress test data. Unique characteristics are discussed and simple equivalent circuit models are described to assist application engineers in the optimal use of this new component.

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